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Synthetic Polymeric Membranes
Characterization by Atomic Force Microscopy
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Main description:

Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.


Contents:

Synthetic Membranes for Membrane Processes.- Atomic Force Microscopy.- Nodular Structure of Polymers in the Membrane.- Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface.- Cross-sectional AFM Image.- Adhesion.- Membrane Surface Morphology and Membrane Performance.


PRODUCT DETAILS

ISBN-13: 9783642093272
Publisher: Springer (Springer-Verlag Berlin and Heidelberg GmbH & Co. K)
Publication date: November, 2010
Pages: 198
Weight: 454g
Availability: Available
Subcategories: General Issues, Pharmacology
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