BOOKS BY CATEGORY
Your Account
Radiation Imaging Detectors Using SOI Technology
This book is currently unavailable – please contact us for further information.
Price
Quantity
€42.64
(To see other currencies, click on price)
Paperback / softback
Add to basket  

MORE ABOUT THIS BOOK

Main description:

Silicon-on-Insulator (SOI) technology is widely used in high-performance and low-power semiconductor devices. The SOI wafers have two layers of active silicon (Si), and normally the bottom Si layer is a mere physical structure. The idea of making intelligent pixel detectors by using the bottom Si layer as sensors for X-ray, infrared light, high-energy particles, neutrons, etc. emerged from very early days of the SOI technology. However, there have been several difficult issues with fabricating such detectors and they have not become very popular until recently.

This book offers a comprehensive overview of the basic concepts and research issues of SOI radiation image detectors. It introduces basic issues to implement the SOI detector and presents how to solve these issues. It also reveals fundamental techniques, improvement of radiation tolerance, applications, and examples of the detectors.

Since the SOI detector has both a thick sensing region and CMOS transistors in a monolithic die, many ideas have emerged to utilize this technology. This book is a good introduction for people who want to develop or use SOI detectors.


Contents:

Preface
Acknowledgments
Introduction
Major Issues in SOI Pixel Detector
Basic SOI Pixel Process
Radiation Hardness Improvements
Advanced Process Developments
Detector Research and Developments
Summary
Bibliography
Authors' Biographies


PRODUCT DETAILS

ISBN-13: 9781627056960
Publisher: Morgan and Claypool Life Sciences
Publication date: February, 2017
Pages: None
Weight: 525g
Availability: Not available (reason unspecified)
Subcategories: Medical Diagnosis, Radiology

CUSTOMER REVIEWS

Average Rating